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Scanning Electron Microscopy and X-Ray Microanalysis: A Text for Biologists, Materials Scientists, and Geologists
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Review
From a review of the first edition: `The emphasis throughout has been on practical aspects ... that approach, plus the comprehensiveness of the material covered, makes this a valuable, virtually indispensible, reference work.' Microscope Journal
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Product details
Hardcover: 840 pages
Publisher: Springer; 2nd edition (May 31, 1992)
Language: English
ISBN-10: 0306441756
ISBN-13: 978-0306441752
Product Dimensions:
10.3 x 7.3 x 2.1 inches
Shipping Weight: 4.3 pounds
Average Customer Review:
3.7 out of 5 stars
7 customer reviews
Amazon Best Sellers Rank:
#2,065,037 in Books (See Top 100 in Books)
Great technical asset, must have for technical library
Goldstein et al have written a book that serves as an excellent introduction to the SEM, and is also a formidable reference. When I took SEM at NC State University, it was taught from this book. Between our professor and this text, I learned the ins and outs of the SEM, and I keep the book within arms reach whenever I'm at work.Goldstein covers everything from the basics of operation, through image formation, sample prep, usage in particular fields of study -- everything!If you get one SEM book, get this one.
This was an excellent book (5 stars) but has been superseded by the 3rd edition. Buy it only for historical interest.
This is an excellent textbook for graduate students majoring in Materials Science. The text is easy to read, and accompanied by plenty of photographs and schematics, is easy to understand. Covers almost every aspect of SEM and X-ray micro-analysis e.g. underlying science, technology, and practical use. Each chapter begins at a basic level and gradually develops the subject to intricate detail, and depending on the level of study one may skip chapters or part of a chapter.
This book, although not the newest textbook on the market, is THE textbook to have if you are looking for the history, theory or applications of electron microscopy and x-ray microanalysis. Well written, thorough and packed full of well-designed diagrams illustrating the principles described. I've used this textbook in classroom and laboratory settings with excellent results. Looking forward to the next edition!
It was a privilege to learn the subjects of SEM and TEM from the the author of this book himself (David Joy). This is an excellent book which starts from the basics and it depends on the researcher how deep he wanna go. The book provides in depth analysis as well if required. Great resource book.
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